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Macro Inspection Equipment - List of Manufacturers, Suppliers, Companies and Products

Macro Inspection Equipment Product List

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Macro inspection device "ARCscan Type RE & ME compatible"

A tool that enables high-speed, high-sensitivity, and large-area macro observation, which has been difficult until now!

The "ARCscan Type RE & ME compatible" is a device that enables the analysis and evaluation of pattern shape uniformity over a wide area, which is difficult to observe at the microscopic level. It achieves optimal optical conditions for the observation target, making high-sensitivity, high-speed, and large-area inspections possible, which were previously challenging. It features a dual specification with "Type: RE," which allows macro observation under optimal conditions for patterns, and "Type: ME," which enables nano evaluation using a macro optical system. 【Features】 ■ Achieves optimal optical conditions for the observation target ■ Enables high-sensitivity, high-speed, and large-area inspections that were previously difficult *For more details, please refer to the catalog or feel free to contact us.

  • Other inspection equipment and devices

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Substrate Surface Macro Inspection Device 'Stealth300V Series'

Comprehensive substrate inspection with high sensitivity and speed.

The "Stealth300V Series" is a device that captures the reflected/scattered light from the surface of substrates/membranes illuminated by an LED line using a super-sensitive camera, allowing for the analysis of their surface conditions. It enables high-speed inspection of overall trends in substrates that could not be detected by conventional localized (micro) inspections. It has a proven track record in inspecting film uniformity, exposure uniformity, and surface scratches in OLEDs and semiconductors. Additionally, by equipping a fine surface foreign matter inspection optical system option, it is also capable of detecting foreign matter equivalent to PSL 0.3um. 【Features】 ■ High-speed, comprehensive measurement ■ High-sensitivity imaging ■ Easy maintenance ■ Customizable inspection software to meet customer specifications

  • Visual Inspection Equipment

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Semiconductor Macro Inspection Equipment (iFocus)

Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.

Using patented OTF (On the Fly) technology and two inspection cameras to simultaneously capture bright and dark fields, the inspection process time is reduced by half. Additionally, 3D inspections are possible, enabling the inspection of coplanarity for bumps used in WLSCP packages and others.

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment
  • Tester

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